TEM images are formed using transmitted electrons (instead of the visible light) which can produce magnification details up to 1,000,000x with resolution better than 10 Ao. The images can be resolved over a fluorescent screen or a photographic film. Further more the analysis of the X-ray produced by the interaction between the accelerated electrons with the sample allows detemining the elemental composition of the sample with high spatial resolution.
- EDS detector
- HAADF detector
- Gatan digital imaging system Ion beam milling facility